Teseq’s
new NSG 3040A is an easy-to-use multifunction generator that simulates
electromagnetic interference effects for immunity testing in conformity with
international, national and manufacturers’ standards including the latest
IEC/EN standards. The NSG 3040A system is designed to fulfill conducted EMC
test requirements for CE mark testing, which generally include combination wave
surge, Electrical Fast Transient (EFT) pulses and Power Quality Testing (PQT).
Extensive expansion capabilities enable the system to be configured for a much
broader range of applications.
Featuring an innovative, modular design, the NSG 3040A is a versatile system that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories.
Using
state-of-the-art components, the self-contained modules set new standards with
respect to switching and phase accuracy and exceed the existing standards’
requirements.
A 7” touch panel display with superb contrast and color makes controlling the NSG 3040A easy. For fast and efficient data entry, input devices include an integrated keyboard and a thumbwheel with additional keys for sensitivity adjustment. To achieve quick, reliable results in a development environment a standardized test can be initiated with just a few “clicks” using the integrated Test Assistance (TA) function.
Convenient touch input buttons make each parameter’s value highly visible and allow the user to quickly select and modify all settings. A stylus is not necessary, and ramp functions can be programmed quickly and easily. Multi-step test procedures can be created and their sequence or parameter values can be changed easily.
With
expert mode users can make manual parameter changes using the thumbwheel while
a test is under way, providing an effective and fast method for identifying
critical threshold values.
The NSG 3040A has an Ethernet port for external PC control. The Windows-based control software simplifies test programming and compilation of complex test sequences with various types of tests.
Test reports can be generated during the test operation, allowing the operator to enter observations as the test progresses and increasing the efficiency of long-term tests.
Combination wave pulse 1, 2/50 - 8/20 μs (Hybrid-Surge pulse)
Pulse conforms to IEC/EN 61000-4-5
|
Parameter |
Value |
|
Pulse voltage (open circuit) |
±200 V to 4.8 kV (in 1 V steps) |
|
Pulse current (short circuit) |
±100 A to 2.4 kA |
|
Impedance |
2/12 Ω |
|
Polarity |
positive / negative / alternate |
|
Pulse repetition |
10 s, up to 9'999 s (in 1 s steps) |
|
Test duration |
1 to 99'999 pulses, continuous |
|
Phase synchronization |
asynchronous, synchronous 0 to 359º (in 1º steps) |
|
Coupling |
IEC (external / internal) |
Burst (EFT) 5/50 ns
Pulse conforms to IEC/EN 61000-4-4
|
Parameter |
Value |
|
Pulse amplitude |
±200
V to 4.8 kV (in 1 V steps) - open circuit |
|
Burst frequency |
100 Hz to 1000 kHz |
|
Polarity |
positive / negative / alternate |
|
Repetition time |
10 ms to 9'999 s |
|
Burst duration |
10 μs to 9'999 s, single pulse |
|
Test duration |
1 s to 9'999 s, 1 min to 1600 min, endless |
|
Phase synchronization |
asynchronous, synchronous 0 to 359º (in 1º steps) |
|
Coupling |
external / internal |
Dips, Interrupts & Variations
Conforms to IEC/EN 61000-4-11, IEC/EN 61000-4-29
|
Parameter |
Value |
|
Dips, Interrupts & Variations |
From EUT voltage input to 0 V, 0% |
|
Uvar with optional variac |
depending on model (VAR 3005A) |
|
Uvar with step transformer |
0, 40, 70, 80% (INA 650x) |
|
Peak inrush current capability |
>500 A (at 230 V) |
|
Switching times |
1 to 5 μs (100 Ω load) |
|
Event time (T-Event) |
20 µs to 9'999 s, 0.5 to 9'999 cycles |
|
Repetition time |
10 ms to 9'999 s, 1 to 9'999 s |
|
Test duration |
1 to 99’999 events, continuous |
|
Phase synchronization |
asynchronous, synchronous 0 to 359º (in 1º steps) |
